- ELECTRONIC BEAM
- wavelength SMALLER than light
- so a HIGHER RESolution image
- image is PROJECTED onto a SCREEN/photographic plate
- ELECTROMAGNETS are used for focusing and magnifying
- electrons are DEFLECTED by AIR particles
- so sample needs to be DEAD
- area needs to be VACUUMED
SEM: magnification: x100 000
resolution: 0.2 nm
electrons DO NOT PASS through, electrons BOUNCE OFF the sample, elctrons are collected to produce a 3D image of the SURFACE
TEM: magnification: x500 000
resolution: 0.2 nm
electrons PASS THROUGH, pass through with difficulty in DENSER areas (causing CONTRAST), and a 2D image is produced
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