Transmission electron microscopes (TEM)
-The electron BEAM passes through a very THIN PREPARED SAMPLE.
-Electrons pass through the DENSER parts of the sample LESS EASILY, so giving some contrast.
-The final image produced is 2D (two dimensional).
-The magnification possible is x500 000.
Scanning electron microscope (SEM)
-The electron beam is directed onto a SAMPLE.
-The electrons DON'T pass through the specimen.
-They are 'BOUNCED OFF' the sample.
-The final image produced is 3D (three dimensional).
-The magnification possible is x100 000.